 sales@drjscientific.com      0086-18352836805
You are here: Home / Products / Scanning Electron Microscope / Scanning Electron Microscope-SEM / Desktop SEM Scanning Electron Microscope for Powder

Product Category

Contact Us

Hot-Selling Products

loading

Share to:
facebook sharing button
twitter sharing button
line sharing button
wechat sharing button
linkedin sharing button
pinterest sharing button
sharethis sharing button

Desktop SEM Scanning Electron Microscope for Powder

Availability:
Quantity:

Advantages

1.High resolution and good imaging quality.

2.Open type pre-aligned tungsten wire cathode.

3.Chinese and English operation interface, with one-key imaging function.

4.With low vacuum charge reduction function, it can realize observation without spraying gold.



Specifications

Item

Desktop DJ-SEM300S

Resolution

3nm@30kv(SE)  6nm@30kv(BSE)

Magnification

8X~300,000X

Filament

Schottky field fires electron guns

Accelerating voltage

0~30kv

Automatic function

Electron gun heating, bias, centering, focusing, brightness, contrast, astigmatism elimination, astigmatism memory, etc., automatic correction, automatic fault detection.

Detector

High vacuum secondary electron detector,Semiconductor quadrant backscatter detector,CCD

Sample stage

Manual stage

Four-axis motor table

Five-axis automatic table




Travel range

X

0~80mm

0~70mm

0~80mm

Y

0~60mm

0~50mm

0~50mm

Z

0~50mm

0~45mm

0~30mm

R

360°

360°

360°

T

-5°~90°

-5°~90°(Manual)

-5°~70°

Maximum sample diameter

175mm

175mm

340mm

Maximum sample height

40mm

35mm

20mm

Vacuum system

Turbomolecular pump,Mechanical pump

Low vacuum mode

Low vacuum range: 10~270pa continuously adjustable, vacuum degree switching mode: one-key switching, vacuum degree switching time: ≤90 seconds

Optional detector

EBSD/EDS/CL

Optional accessories

EBL\high and low temperature table\nano console\stretching table





Application:

Scanning electron microscope (SEM) is a precision instrument used for high-resolution micro-area analysis. At present, scanning electron microscope has been widely used in life science, physics, chemistry, justice, earth science, Micro research in the fields of materials science and industrial production.

企业微信截图_6e7668d3-4651-4fbd-9b35-abc638f2916a



Previous: 
Next: 
Chemical, physical and structural,
cleanliness analysis solution supplier
Nowadays we help users better understand a wide variety of materials, from polymers and mining to metals and from electronic chip to component.

QUICK LINK

PRODUCTS

CONTACT
  0086-18352836805
  sales@drjscientific.com
 0086-18352836805
 No. 35 Jingsheng Rd., Huishan District, Wuxi City, Jiangsu Province, China.
Copyright © 2021 Dr.J Scientific