 sales@drjscientific.com      0086-18352836805
You are here: Home / Products / Scanning Electron Microscope / Scanning Electron Microscope-SEM / Tabletop Sem Scanning Electron Microscope

Product Category

Contact Us

Hot-Selling Products

loading

Share to:
facebook sharing button
twitter sharing button
line sharing button
wechat sharing button
linkedin sharing button
pinterest sharing button
sharethis sharing button

Tabletop Sem Scanning Electron Microscope

Availability:
Quantity:

1. General introduction

The maximum magnification of the  DJ-SEM150 series  Tabletop Scanning Electron Microscope is 150,000 times, and the resolution is up to 5nm (SE, 30kV). It is equipped with SE (secondary electron) detector and BSE (backscattered electron) detector. The load platform can be configured with three axes (X, Y, R). The manual platform can also be upgraded to a five-axis (X, Y, R, Z, T) automatic platform. The EDS spectrum analyzer can be configured in all series of products. The products include the following configurations:


Item

Model

With Detector Option

With Stage Option

Mini-SEM

DJ-SEM150

DJ-SEM150S

DJ-SEM150S-MS

DJ-SEM150D

DJ-SEM150D-MS

DJ-SEM150D-ST


企业微信截图_d21fe78b-a0fb-4e80-9291-d602a2c2ca0f

DJ-SEM150


















2. Description

(1) Max Magnification 150,000x

(2) Accelerating Voltage:1kV to 30kV, High image resolution, High image resolution;

(3) Signal Detection: SE Detector + BSE Detector

(4) Equipped with 4 iris diaphragms (30, 50, 50, 100μm), which can provide high-resolution images by changing the size of the electron beam;

(5) CCD sample navigation is optional

(6) EDS is optional, for component analysis

(7) Tilt Stage configuration (0~90°) (optional)


3. Specifications

Resolution

5nm (30kV,SE)

Magnification

20x~150,000x

Accelerating Voltage

1~30kV

Detector

SE Detector, Optional BSE detector, EDS, etc.

Electron Gun

Pre centered tungsten filament cartridge

Lens system

Focus Lens:2-stage Electromagnetic Condenser Lens
Objective Lens: 1-stage Electromagnetic Objective Lens

Stage

3 axis System, X, Y-axis : 35mm / R-axis: 360°

Optional 5-axis sample stage: X:40mm, Y:40mm, Z:40mm, R:360°, T:0~90°

Image shift

Image shift X, Y Image Shift (±150um)

Iris Diaphragms

Adjustable iris diaphragms(30/50/50/100μm)

Max Sample size

80mm in diameter, 35mm in height

Image Scanning system

Fast Scan:320*240   Slow Scan: 640*480
Photo Mode 1:1280*960    Photo Mode 2:2560*1920   Photo Mode 3:5120*3840

Automatic Function

Auto start,Auto focus,Auto Brightness/Contrast

Image format

BMP, JPEG, PNG, TIFF

Image Data display

Magnification,Detector type,Accelerating Voltage,Vacuum mode,Logo(Text),Date and time,Text marker,scale bar

Vacuum system

High vacuum mode, mechanical pump, molecular pump, vacuuming time: within 3 minutes

Device Volume

460(W)*600(L)*950(H)mm

Equipment environment

Temperature:15℃~30℃ , Humidity:70% or less

Power source:Single phase 100~240V AC, 1KW, 50/60Hz




Previous: 
Next: 
Chemical, physical and structural,
cleanliness analysis solution supplier
Nowadays we help users better understand a wide variety of materials, from polymers and mining to metals and from electronic chip to component.

QUICK LINK

PRODUCTS

CONTACT
  0086-18352836805
  sales@drjscientific.com
 0086-18352836805
 No. 35 Jingsheng Rd., Huishan District, Wuxi City, Jiangsu Province, China.
Copyright © 2021 Dr.J Scientific